The Applied Beams SEM (Scanning Electron Microscope) is a refurbished electron microscope used to study free-electron-induced light-matter interaction processes.

Specifications

  • LaB6 cathode, image resolution < 4 nm at 30 kV
  • Beam energy from 500 V to 40 kV in steps of 100 V
  • 3x to 600,000 magnification
  • 6-axis, fully eucentric stage, 95mm working distance
  • X = 100 mm, Y = 100mm and Z = 50 mm
  • Eucentric tilt -5 degrees to +70 degrees
  • Rotation 360 degrees
  • Internal chamber size 313*313*313 mm (width*depth*height)
  • Chamber opening 310*250 mm
  • In-Chamber E-T Detector
  • Diffusion pump
  • 300 HiPace Turbo Pump, Dry Scroll Roughing pump, TIC Controller with programmable interlocks, auto vent cart mounted and flexible foreline
  • Custom side plate to fit spectrometer
  • Standalone K.E. Developments Limited IR Camera
  • Beam Diameter measurements with manual calculations
  • Picoammeter to measure beam current
  • SEM is operated with Caesium 7 software (developed by Applied beams), running on Windows 7
  • 10+ ports on chamber

 

https://www.appliedbeams.com/

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