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- 6/20/2012 SEM and EBSD
Spot 4a 70 deg tilt lowmag.tif
Spot 4a 250kx faults and dirt.tif
Spot 4a 260kx faults and dirt.tif
Spot 4a 70 deg tilt 75kx.tif
Spot 4a 70 deg tilt 130kx.tif - 67/2710/2012 After MIT Retook UV-VIS spectrophotometer after lamp change, retook UV-VIS measurement for all gold samples. Measurement artifact is now observed from 2300-2500nm.
20120709 20120627 Au UV-VIS.xlsx
Sample 4B
- 6/11/2012 Laser cut into 7x7 mm sample, solvent clean
Debris due to laser cut observed
On 6/13/2012, found out that this laser cutting procedure raises a normal silicon sample temperature high enough to hard-bake the photoresist, so it could have initiated gold diffusion on 4b.
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