...
- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
- 6/16/2012 Remove resist
- 7/26/2012 IV on diode, taken with Keithley 4200 after instrument autocalibration. Good rectifying behavior is observed only for diode sample 2b (n-Si, (100)). Diode sample 3a (p-type, (111)) does not rectify.
20120726 Au IV diode.xlsx
Sample 3B
- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
- 6/16/2012 Remove resist
...
- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
- 6/16/2012 Remove resist, take UV-VIS measurement
20120616 UV-VIS transmission Au 3d.Sample.Raw.csv
20120616 UV-VIS transmission Au 3d amorphous.Sample.Raw.csv
20120616 UV-VIS reflection Au 3d.Sample.Raw.csv
20120616 UV-VIS reflection Au 3d amorphous.Sample.Raw.csv - 7/10/2012 Retook UV-VIS after lamp change
20120709 Au UV-VIS.xlsx
Sample 3E
- 6/5/2012 Raman measurements
Sample 3E raman.xlsx