Here are relevant prior publications about ACIS and XIS instrument performance, on the ground and in orbit.
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Leaky Buckets related publications
Presentation at IACHEC, April 2011
https://wikis-mit-edu.ezproxyberklee.flo.org/confluence/download/attachments/61572295/Grant.LeakyBuckets.pdf
Poster at AAS (ACIS only), May 2011
AAS11.poster.pdf
Poster at Suzaku Science Conference, July 2011
Suzaku11.poster.letter.pdf
XIS Papers and Resources
XIS CTI Monitoring:
LaMarr, et al. 2008, Proc SPIE, 7011, 66 PDF
Front- and back-illuminated x-ray CCD performance in low- and high-Earth orbit: performance trends of Suzaku XIS and Chandra ACIS detectors
http://adsabs.harvard.edu/abs/2008SPIE.7011E..66L
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LaMarr, et al. 2008, Proc SPIE, 7011, 66 PDF
Front- and back-illuminated x-ray CCD performance in low- and high-Earth orbit: performance trends of Suzaku XIS and Chandra ACIS detectors
http://adsabs.harvard.edu/abs/2008SPIE.7011E..66L
Grant, et al. 2005, Proc. SPIE, 6276 5898 PDF
Long-term trends in radiation damage of Chandra X-ray CCDs
http://adsabs.harvard.edu/abs/2005SPIE.5898..201G
(The poster outside CEG's office updates some of this.)
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Markevitch et al. 2003, ApJ, 583, 70
Chandra Spectra of the Soft X-ray Diffuse Background
http://adsabs.harvard.edu/abs/2003ApJ...583...70M
ACIS General Information
Garmire et al. 2003, SPIE, 4851, 28
Advanced CCD imaging spectrometer (ACIS) instrument on the Chandra X-ray Observatory
http://adsabs.harvard.edu/abs/2003SPIE.4851...28G
Chandra radiation environment:
Grant, Lamarr, Bautz, O'Dell, 2010, Proc. SPIE, 7732
Using ACIS on the Chandra X-ray Observatory as a particle radiation monitor
http://adsabs.harvard.edu/abs/2010SPIE.7732E..80G
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(and others, but these are the main ones)
Prigozhin, et al. 2000, Proc SPIE, 4012, 720
Radiation damage in the Chandra x-ray CCDs
http://adsabs.harvard.edu/abs/2000SPIE.4012..720P
Prigozhin, et al. 2000, Proc SPIE, 4140, 123
Characterization of the radiation damage in the Chandra x-ray CCDs
http://adsabs.harvard.edu/abs/2000SPIE.4140..123P
Miscellaneous papers on CTI after bakeout, contamination, etc.
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