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- 6/15/2012 TEM. FIB sample is unpolished at present, so visible amorphized regions are present on faces of coupon. Nevertheless, sample is single-crystalline and free of stacking faults and cellular breakdown.
Lowmag offaxis 8.jpg
Very low mag.jpg
Lowmag offaxis 6.jpg
Highmag offaxis 3.jpg
FFT of Highmag offaxis 3.jpg
Highmag offaxis 4.jpg
FFT of Highmag offaxis 4.jpg
Highmag offaxis 5.jpg
FFT of Highmag offaxis 5.jpg
Highmag offaxis 6.jpg
FFT of Highmag offaxis 6.jpg
Highmag offaxis 8.jpg
FFT of Highmag offaxis 8.jpg - 7/1726/2012 IV on diode. Good , taken with Keithley 4200 after instrument autocalibration. Good rectifying behavior is observed only for diode sample 2b (n-Si, (100)). Diode sample 3a (p-type, (111)) does not rectify. Calibrated with instrument current offset.
20120717 IV Diode Au 2b calibrated20120726 Au IV diode.xlsx
Sample 2D
- 6/5/2012 Raman measurements
Sample 2D raman.xlsx