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- 6/15/2012 TEM. FIB sample is unpolished at present, so visible amorphized regions are present on faces of coupon. Nevertheless, sample is single-crystalline and free of stacking faults and cellular breakdown.
Lowmag offaxis 8.jpg
Very low mag.jpg
Lowmag offaxis 6.jpg
Highmag offaxis 3.jpg
FFT of Highmag offaxis 3.jpg
Highmag offaxis 4.jpg
FFT of Highmag offaxis 4.jpg
Highmag offaxis 5.jpg
FFT of Highmag offaxis 5.jpg
Highmag offaxis 6.jpg
FFT of Highmag offaxis 6.jpg
Highmag offaxis 8.jpg
FFT of Highmag offaxis 8.jpg - 7/1317/2012 IV on diode. Good rectifying behavior is observed only for diode sample 2b (n-Si, (100)). Diode sample 3a (p-type, (111)) does not rectify. Updated to include the IV data when the connector connection is reversed.
20120713 Calibrated with instrument current offset.
20120717 IV Diode Au 2b calibrated.xlsx
Sample 2D
- 6/5/2012 Raman measurements
Sample 2D raman.xlsx