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- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
- 6/16/2012 Remove resist, take UV-VIS measurement
20120616 UV-VIS transmission Au 3d.Sample.Raw.csv
20120616 UV-VIS transmission Au 3d amorphous.Sample.Raw.csv
20120616 UV-VIS reflection Au 3d.Sample.Raw.csv
20120616 UV-VIS reflection Au 3d amorphous.Sample.Raw.csv - 7/10/2012 Retook UV-VIS after lamp change
20120709 Au UV-VIS.xlsx
Sample 3E
- 6/5/2012 Raman measurements
Sample 3E raman.xlsx