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6/8/2012 FIB-processed for TEM and imaged on JEOL 2100. Stacking faults throughout active layer observed.
Lowmag Focus low.jpg
Active layer showing stacking faults and possible precip.jpg
Active layer faults and planes6.jpg
Active layer faults and planes4.jpg
Active layer faults and planes3.jpg
6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
Sample 3b
6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut